Tateishi, Katsuhiko, Hiroki Iwamoto, Shinto Eguchi, and Yasushi Nagata. “MT Method for Anomaly Detection and Classification Using EM-λ Algorithm”. Quality Innovation Prosperity 28, no. 1 (March 31, 2024): 1–14. Accessed November 21, 2024. https://qip-journal.eu/index.php/QIP/article/view/1964.